X-ray diffraction imaging: technology and applications
- Author
- Greenberg, Joel AlterIniewski, Krzysztof
- Publisher
- Taylor & Francis;CRC
- Language
- English
- Year
- 2019
- Page
- 255
- ISBN
- 9780429196492,0429196490,9780429587924,0429587929,9780429589867,0429589867,9780429591808,0429591802,9781138387027,1138387029
- File Type
- pdf
- File Size
- 11.8 MiB
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