Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
- Author
- Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr
- Publisher
- Springer International Publishing
- Language
- English
- Edition
- 1st ed. 2019
- Year
- 2019
- Page
- XLI, 460
- ISBN
- 978-3-030-26171-9,978-3-030-26172-6
- File Type
- pdf
- File Size
- 20.7 MiB
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