Modeling, Analysis, Design, and Tests for Electronics Packaging Beyond Moore

Modeling, Analysis, Design, and Tests for Electronics Packaging Beyond Moore

Author
Hengyun ZhangFaxing CheTingyu LinWensheng Zhao
Publisher
Woodhead Publishing
Language
English
Year
2019
Page
434
ISBN
0081025327,9780081025321
File Type
pdf
File Size
18.8 MiB

Modeling, Analysis, Design and Testing for Electronics Packaging Beyond Moore provides an overview of electrical, thermal and thermomechanical modeling, analysis, design and testing for 2.5D/3D. The book addresses important topics, including electrically and thermally induced issues, such as EMI and thermal issues, which are crucial to package signal and thermal integrity. It also covers modeling methods to address thermomechanical stress related to the package structural integrity. In addition, practical design and test techniques for packages and systems are included. Includes advanced modeling and analysis methods and techniques for state-of-the art electronics packaging Features experimental characterization and qualifications for the analysis and verification of electronic packaging design Provides multiphysics modeling and analysis techniques of electronic packaging

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