Understanding Faults: Detecting, Dating, and Modeling
- Author
- David Tanner (editor), Christian Brandes (editor)
- Publisher
- Elsevier
- Language
- English
- Edition
- 1
- Year
- 2019
- Page
- 380
- ISBN
- 0128159855,9780128159859
- File Type
- pdf
- File Size
- 46.3 MiB
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