Accelerating test, validation and debug of high speed serial interfaces
- Author
- Fan, YongquanFan, Yongquan
- Publisher
- Springer
- Language
- English
- Year
- 2010;2011
- Page
- 194
- ISBN
- 9789048193974,9789048193981,9048193974,9048193982
- File Type
- pdf
- File Size
- 4.1 MiB
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