Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
- Author
- Behnam Ghavami, Mohsen Raji
- Publisher
- Springer International Publishing;Springer
- Language
- English
- Edition
- 1st ed.
- Year
- 2021
- Page
- XIII, 114
- ISBN
- 9783030516093,9783030516109
- File Type
- pdf
- File Size
- 3.9 MiB
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