Characterization, Testing, Measurement, and Metrology
- Author
- Chander Prakash (editor), Sunpreet Singh (editor), J. Paulo Davim (editor)
- Publisher
- CRC Press
- Language
- English
- Edition
- 1
- Year
- 2020
- Page
- 204
- ISBN
- 0367275155,9780367275150
- File Type
- pdf
- File Size
- 25.9 MiB
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