Home Advanced Search

Advanced Search - Page 1

Hot-Carrier Reliability of MOS VLSI Circuits
  • PDF
  • English
  • Year: 1993
  • Author: Yusuf Leblebici, Sung-Mo (Steve) Kang (auth.)
Electrothermal Analysis of VLSI Systems
  • PDF
  • English
  • Year: 2002
  • Author: Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo Steve Kang (auth.)
Design Automation for Timing-Driven Layout Synthesis
  • PDF
  • English
  • Year: 1993
  • Author: Sachin S. Sapatnekar, Sung-Mo Kang (auth.)
Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science Book 227)
  • EPUB
  • English
  • Author: Yusuf Leblebici
Modeling of Electrical Overstress in Integrated Circuits
  • PDF
  • English
  • Year: 1995
  • Author: Carlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury (auth.)
CMOS Multichannel Single-Chip Receivers for Multi-Gigabit Optical Data Communications
  • PDF
  • English
  • Year: 2007
  • Author: Paul Muller, Yusuf Leblebici (auth.)
Microelectronics Education: Proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15–16, 2004
  • PDF
  • English
  • Year: 2004
  • Author: S-M. S. Kang (auth.), Adrian M. Ionescu, Michel Declercq, Maher Kayal, Yusuf Leblebici (eds.)
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
  • PDF
  • English
  • Year: 2011
  • Author: Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici (auth.)
Nanosystems Design and Technology
  • PDF
  • English
  • Year: 2009
  • Author: Giovanni Micheli, Yusuf Leblebici, Martin Gijs, Janos Vörös (auth.)
Oncologic Imaging: Bone Tumors
  • PDF
  • English
  • Year: 2017
  • Author: Heung Sik Kang, Joong Mo Ahn, Yusuhn Kang (auth.)
search