Home Advanced Search

Advanced Search - Page 1

Information Systems Security: 6th International Conference, ICISS 2010, Gandhinagar, India, December 17-19, 2010. Proceedings
  • PDF
  • English
  • Year: 2011
  • Author: Sriram K. Rajamani (auth.), Somesh Jha, Anish Mathuria (eds.)
Model Checking Software: 10th International SPIN Workshop Portland, OR, USA, May 9–10, 2003 Proceedings
  • PDF
  • English
  • Year: 2003
  • Author: Theo C. Ruys (auth.), Thomas Ball, Sriram K. Rajamani (eds.)
Protocols for Authentication and Key Establishment
  • PDF
  • English
  • Year: 2003
  • Author: Colin Boyd, Anish Mathuria (auth.)
CONCUR 2004 - Concurrency Theory: 15th International Conference, London, UK, August 31 - September 3, 2004. Proceedings
  • PDF
  • English
  • Year: 2004
  • Author: Tony Andrews, Shaz Qadeer, Sriram K. Rajamani, Jakob Rehof, Yichen Xie (auth.), Philippa Gardner, Nobuko Yoshida (eds.)
Automated Technology for Verification and Analysis: 6th International Symposium, ATVA 2008, Seoul, Korea, October 20-23, 2008. Proceedings
  • PDF
  • English
  • Year: 2008
  • Author: Sriram K. Rajamani (auth.), Sungdeok (Steve) Cha, Jin-Young Choi, Moonzoo Kim, Insup Lee, Mahesh Viswanathan (eds.)
Integrated Formal Methods: 4th International Conference, IFM 2004, Cnaterbury, UK, April 4-7, 2004. Proceedings
  • PDF
  • English
  • Year: 2004
  • Author: Thomas Ball, Byron Cook, Vladimir Levin, Sriram K. Rajamani (auth.), Eerke A. Boiten, John Derrick, Graeme Smith (eds.)
Malware Detection
  • PDF
  • English
  • Year: 2007
  • Author: Brian Witten, Carey Nachenberg (auth.), Mihai Christodorescu, Somesh Jha, Douglas Maughan, Dawn Song, Cliff Wang (eds.)
Protocols for authentication and key establishment
  • PDF
  • English
  • Year: 2011
  • Author: Boyd, Colin;Mathuria, Anish
Protocols for Authentication and Key Establishment
  • PDF
  • English
  • Year: 2008
  • Author: Colin Boyd, Anish Mathuria
Nanoelectronic Circuit Design
  • PDF
  • English
  • Year: 2011
  • Author: Deming Chen, Niraj K. Jha (auth.), Niraj K. Jha, Deming Chen (eds.)