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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
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  • Year: 2002
  • Author: Michael L. Bushnell, Vishwani D. Agrawal (auth.)
Neural Models and Algorithms for Digital Testing
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  • Year: 1991
  • Author: Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil (auth.)
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
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  • English
  • Year: 2000
  • Author: M. Bushnell, Vishwani Agrawal
Solutions to Problems from Essentials of Electronic Testing
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  • english
  • Author: M. L. Bushnell and V. D. Agrawal
Economics of Electronic Design, Manufacture and Test
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  • English
  • Year: 1994
  • Author: Vishwani D. Agrawal (auth.), Magdy Abadir, Tony Ambler (eds.)
Concurrent and Comparative Discrete Event Simulation
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  • English
  • Year: 1994
  • Author: Ernst G. Ulrich, Vishwani D. Agrawal, Jack H. Arabian (auth.)
Efficient Branch and Bound Search with Application to Computer-Aided Design
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  • English
  • Year: 1996
  • Author: Xinghao Chen, Michael L. Bushnell (auth.)
Computerized buckling analysis of shells
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  • English
  • Year: 1985
  • Author: D. Bushnell (auth.)
Design Automation. Automated Full-Custom VLSI Layout Using the ULYSSES Design Environment
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  • English
  • Year: 1988
  • Author: Michael Bushnell (Auth.)
Essentials of Electronic Testing - For Digital, Memory and Mixed-Signal VLSI Circuits
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  • English
  • Year: 2000
  • Author: M. Bushnell, V. Agrawal
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