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Graph-Based Representations in Pattern Recognition: 6th IAPR-TC-15 International Workshop, GbRPR 2007, Alicante, Spain, June 11-13, 2007. Proceedings
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  • Year: 2007
  • Author: Kaspar Riesen, Michel Neuhaus, Horst Bunke (auth.), Francisco Escolano, Mario Vento (eds.)
Graph Classification and Clustering Based on Vector Space Embedding (Series in Machine Perception and Artificial Intelligence)
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  • Year: 2010
  • Author: Kaspar Riesen, Horst Bunke
Bridging the Gap Between Graph Edit Distance and Kernel Machines (Series in Machine Perception and Artificial Intelligence)
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  • English
  • Year: 2007
  • Author: Michel Neuhaus, Horst Bunke
Image Analysis and Processing – ICIAP 2005: 13th International Conference, Cagliari, Italy, September 6-8, 2005. Proceedings
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  • Year: 2005
  • Author: Horst Bunke, Christophe Irniger, Michel Neuhaus (auth.), Fabio Roli, Sergio Vitulano (eds.)
Structural Pattern Recognition with Graph Edit Distance: Approximation Algorithms and Applications
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  • Year: 2016
  • Author: Kaspar Riesen
Graph classification and clustering based on vector space embedding
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  • Year: 2010
  • Author: Riesen K., Bunke H.
Image Analysis and Processing – ICIAP 2009: 15th International Conference Vietri sul Mare, Italy, September 8-11, 2009 Proceedings
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  • Year: 2009
  • Author: Bogdan Gabrys (auth.), Pasquale Foggia, Carlo Sansone, Mario Vento (eds.)
Image Analysis and Processing – ICIAP 2009: 15th International Conference Vietri sul Mare, Italy, September 8-11, 2009 Proceedings
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  • Year: 2009
  • Author: Bogdan Gabrys (auth.), Pasquale Foggia, Carlo Sansone, Mario Vento (eds.)
Graph-Based Representations in Pattern Recognition: 5th IAPR International Workshop, GbRPR 2005, Poitiers, France, April 11-13, 2005. Proceedings
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  • Year: 2005
  • Author: Alain Bretto, Luc Gillibert (auth.), Luc Brun, Mario Vento (eds.)
Graph-Based Representations in Pattern Recognition: 7th IAPR-TC-15 International Workshop, GbRPR 2009, Venice, Italy, May 26-28, 2009. Proceedings
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  • Year: 2009
  • Author: Nadia Payet, Sinisa Todorovic (auth.), Andrea Torsello, Francisco Escolano, Luc Brun (eds.)
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