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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS
  • PDF
  • English
  • Year: 2018
  • Author: Robert E. Dinnebier; Andreas Leineweber; John S.O. Evans
Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS
  • EPUB
  • English
  • Year: 2018
  • Author: Robert E. Dinnebier; Andreas Leineweber; John S.O. Evans
X-ray Absorption Spectroscopy for the Chemical and Materials Sciences
  • EPUB
  • English
  • Year: 2018
  • Author: John Evans
Elements of a Sustainable World
  • PDF
  • English
  • Year: 2020
  • Author: John Evans
X-ray Absorption Spectroscopy for the Chemical and Materials Sciences
  • PDF
  • English
  • Year: 2017
  • Author: John Evans
Gramsci, Good Sense, and Critical Folklore Studies
  • PDF
  • English
  • Author: Gencarella S.O.
Principles of electronic materials and devices
  • ZIP
  • English
  • Year: 2006
  • Author: Kasap S.O.
[Article] A system for measuring dielectric properties at frequencies from 8.2–12.4 GHz
  • PDF
  • English
  • Year: 1972
  • Author: Nelson S.O.
Optoelectronics and Photonics: Principles and Practices
  • PDF
  • English
  • Year: 2001
  • Author: S.O. Kasap
Principles of electronic materials and devices
  • DJVU
  • English
  • Year: 2006
  • Author: Kasap S.O.
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