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Applications of Organometallic Chemistry in the Preparation and Processing of Advanced Materials
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  • English
  • Year: 1995
  • Author: Jacques Livage (auth.), John F. Harrod, Richard M. Laine (eds.)
Inorganic and Organometallic Oligomers and Polymers: Proceedings of the 33rd IUPAC Symposium on Macromolecules
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  • English
  • Year: 1991
  • Author: T. Don Tilley, Hee-Gweon Woo (auth.), John F. Harrod, Richard M. Laine (eds.)
Inorganic and Organometallic Polymers with Special Properties
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  • English
  • Year: 1992
  • Author: C. Viney (auth.), Richard M. Laine (eds.)
Transformation of Organometallics into Common and Exotic Materials: Design and Activation
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  • English
  • Year: 1988
  • Author: D. Michael, P. Mingos (auth.), Richard M. Laine (eds.)
Sol-Gel Technologies for Glass Producers and Users
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  • English
  • Year: 2004
  • Author: J. Livage (auth.), Michel A. Aegerter, Martin Mennig (eds.)
Wavelet Theory and Application: A Special Issue of the Journal of Mathematical Imaging and Vision
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  • English
  • Year: 1993
  • Author: Andrew Laine (auth.), Andrew Laine (eds.)
UFOs and the National Security State: Chronology of a Coverup, 1941-1973
  • MOBI
  • English
  • Year: 2002
  • Author: Richard M. Dolan, Jacques F. Vallee
Advances in Conceptual Modeling: ER’ 99 Workshops on Evolution and Change in Data Management, Reverse Engineering in Information Systems, and the World Wide Web and Conceptual Modeling Paris, France, November 15–18, 1999 Proceedings
  • DJVU
  • English
  • Year: 1999
  • Author: F. Estrella, Z. Kovacs, J -M. Le Goff, R. McClatchey, M. Zsenei (auth.), Peter P. Chen, David W. Embley, Jacques Kouloumdjian, Stephen W. Liddle, John F. Roddick (eds.)
Advances in Conceptual Modeling: ER’ 99 Workshops on Evolution and Change in Data Management, Reverse Engineering in Information Systems, and the World Wide Web and Conceptual Modeling Paris, France, November 15–18, 1999 Proceedings
  • PDF
  • English
  • Year: 1999
  • Author: F. Estrella, Z. Kovacs, J -M. Le Goff, R. McClatchey, M. Zsenei (auth.), Peter P. Chen, David W. Embley, Jacques Kouloumdjian, Stephen W. Liddle, John F. Roddick (eds.)