Author: Bruno Oertel, Emil Schlander (auth.), G. Alexander, O. Beck, C. E. Benjamins, A. Blohmke, W. Brock, G. Brühl, A. J. Cemach, R. Eschweiler, M. Goerke, J. Hegener, V. Hinsberg, L. Lederer, M. Mann, Max Meyer, Th. Nühsmann, B. Oertel, A. Scheibe, R. Schilling, E. Schlander, P. Stenger (eds.)
Author: Emil Glas (auth.), C. E. Benjamins, E. Glas, M. Hajek, G. Hofer, A. Jesionek, O. Kren, K. M. Menƶel, Edmund Meyer, O. Seifert, R. Sokolowsky, H. Streit, A. Thost (eds.)
Author: Dirk Draheim, Gerald Weber (auth.), John F. Roddick, V. Richard Benjamins, Samira Si-said Cherfi, Roger Chiang, Christophe Claramunt, Ramez A. Elmasri, Fabio Grandi, Hyoil Han, Martin Hepp, Miltiadis D. Lytras, Vojislav B. Mišić, Geert Poels, Il-Yeol Song, Juan Trujillo, Christelle Vangenot (eds.)
Author: Dirk Draheim, Gerald Weber (auth.), John F. Roddick, V. Richard Benjamins, Samira Si-said Cherfi, Roger Chiang, Christophe Claramunt, Ramez A. Elmasri, Fabio Grandi, Hyoil Han, Martin Hepp, Miltiadis D. Lytras, Vojislav B. Mišić, Geert Poels, Il-Yeol Song, Juan Trujillo, Christelle Vangenot (eds.)