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Future Security
  • PDF
  • English
  • Year: 2007
  • Author: Jürgen Beyerer
Pattern recognition: introduction, features, classifiers and principles
  • PDF
  • English
  • Year: 2017
  • Author: Jürgen Beyerer, Matthias Richter, Matthias Nagel
Machine Learning for Cyber Physical Systems: Selected papers from the International Conference ML4CPS 2018
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  • English
  • Year: 2019
  • Author: Jürgen Beyerer, Christian Kühnert, Oliver Niggemann
Pattern Recognition: Introduction, Features, Classifiers and Principles
  • EPUB
  • English
  • Year: 2017
  • Author: Jürgen Beyerer; Matthias Richter; Matthias Nagel
Pattern Recognition: Introduction, Features, Classifiers and Principles
  • PDF
  • English
  • Year: 2017
  • Author: Jürgen Beyerer; Matthias Richter; Matthias Nagel
Machine Vision: Automated Visual Inspection: Theory, Practice and Applications
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  • English
  • Year: 2015
  • Author: Jürgen Beyerer, Fernando Puente León, Christian Frese
Automatische Sichtprüfung: Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung
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  • German
  • Year: 2016
  • Author: Jürgen Beyerer, Fernando Puente León, Christian Frese (auth.)
Automatische Sichtprüfung: Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung
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  • German
  • Year: 2012
  • Author: Jürgen Beyerer, Fernando Puente León, Christian Frese (auth.)
Computer Vision - ACCV 2012 Workshops: ACCV 2012 International Workshops, Daejeon, Korea, November 5-6, 2012, Revised Selected Papers, Part I
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  • English
  • Year: 2013
  • Author: Michael Teutsch, Jürgen Beyerer (auth.), Jong-Il Park, Junmo Kim (eds.)