Author: Laura G Militello Affiliation: University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0127; Cynthia O Dominguez Affiliation: Klein Associates Division of ARA, Fairborn, OH 45324-6232; Gavan Lintern Affiliation: General Dynamics, Falls Church, VA; Gary Klein Affiliation: Klein Associates Division of ARA, Fairborn, OH 45324-6232
Author: Rick A Jones Affiliation: Systems and Information Engineering, University of Virginia, Charlottesville, VA 22904; Barry Horowitz Affiliation: Systems and Information Engineering, University of Virginia, Charlottesville, VA 22904