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Microelectronic failure analysis: desk reference : 2001 supplement
  • PDF
  • English
  • Year: 2001
  • Author: Electronic Device Failure Analysis Society
ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz
  • PDF
  • English
  • Year: 2002
  • Author: ASM International.; Electronic Device Failure Analysis Society
ISTFA 2006 : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
  • PDF
  • English
  • Year: 2006
  • Author: International Symposium for Testing and Failure Analysis
Risks challenging publics, scientists and governments
  • PDF
  • English
  • Year: 2010
  • Author: Scira Menoni; Society for Risk Analysis. Europe. Meeting
Resumos do 7o Encontro Brasileiro de Estatística Bayesiana
  • PDF
  • Portuguese
  • Year: 2004
  • Author: ISBrA – Seção Brasileira da International Society for Bayesian Analysis
Advances in analysis : proceedings of the 4th International ISAAC Congress, York University, Toronto, Canada, 11-16 August 2003
  • PDF
  • English
  • Year: 2005
  • Author: Heinrich G W Begehr; International Society for Analysis, Applications, and Computation. Congress; et al (eds.)
Волшебник Изумрудного города. Буквы и цифры с Элли
  • ZIP
  • Russian
  • Author: Electronic Paradise.
Air Traffic Management and Systems III: Selected Papers of the 5th ENRI International Workshop on ATM/CNS (EIWAC2017)
  • PDF
  • English
  • Year: 2019
  • Author: Electronic Navigation Research Institute
IEEE Std 739-1995, IEEE Recommended Practice for Energy Management in Industrial and Commercial Facilities (The IEEE Bronze Book)
  • PDF
  • English
  • Year: 1998
  • Author: Institute of Electrical & Electronic Engineers
War Room/DailyClout Pfizer Research Volunteers: Consolidated Reports and Op-Eds
  • PDF
  • English
  • Year: 2022
  • Author: Pfizer Documents Analysis
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