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Applied Computational Intelligence: Proceedings of the 6th International FlINS Conference, Blankenberge, Belgium, September 1-3, 2004
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  • English
  • Year: 2004
  • Author: Da Ruan, Pierre D'Hondt, Martine De Cock, Mike Nachtegael, Etienne E. Kerre
Applied artificial intelligence: proceedings of the 7th International FLINS Conference, Genova, Italy, 29-31 August 2006
  • DJVU
  • English
  • Year: 2006
  • Author: Da Duan, Paolo F Fantoni, Martine De Cock, Mike Nachtegael, Etienne E Kerre
Applied artificial intelligence proceedings of the 7th International FLINS Conference, Genova, Italy, 29-31 August 2006
  • DJVU
  • English
  • Year: 2006
  • Author: Da Duan, Paolo F Fantoni, Martine De Cock, Mike Nachtegael, Etienne E Kerre
Applied artificial intelligence: proceedings of the 7th International FLINS Conference, Genova, Italy, 29-31 August 2006
  • PDF
  • English
  • Year: 2006
  • Author: Da Duan, Paolo F Fantoni, Martine De Cock, Mike Nachtegael, Etienne E Kerre
Computational Intelligence in Decision and Control: Proceedings of the 8th International FLINS Conference, Madrid, Spain, 21-24 September 2008 (World Scientific ... Engineering and Information Science)
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  • English
  • Year: 2008
  • Author: Da Ruan, Javier Montero, Jie Lu, Luis Martinez, Pierre D'Hondt, Etienne E. Kerre
Fuzzy Techniques in Image Processing
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  • English
  • Year: 2000
  • Author: Mike Nachtegael, Etienne E. Kerre (auth.), Prof. Dr. Etienne E. Kerre, Drs. Mike Nachtegael (eds.)
Mathematics of Fuzziness – Basic Issues
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  • English
  • Year: 2009
  • Author: Xuzhu Wang, Da Ruan, Etienne E. Kerre (auth.)
Mathematics of Fuzziness – Basic Issues
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  • English
  • Year: 2009
  • Author: Xuzhu Wang, Da Ruan, Etienne E. Kerre (auth.)
Fuzzy If-Then Rules in Computational Intelligence: Theory and Applications
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  • English
  • Year: 2000
  • Author: Ellen Hisdal (auth.), Da Ruan, Etienne E. Kerre (eds.)
Fuzzy Logic: A Spectrum of Theoretical & Practical Issues
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  • English
  • Year: 2007
  • Author: Paul P. Wang, Da Ruan, Etienne E. Kerre (auth.), Paul P. Wang, Da Ruan, Etienne E. Kerre (eds.)
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