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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
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  • Year: 2011
  • Author: Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou (auth.)
Electromigration Modeling at Circuit Layout Level
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  • Year: 2013
  • Author: Cher Ming Tan, Feifei He
Electromigration Modeling at Circuit Layout Level
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  • Year: 2013
  • Author: Cher Ming Tan, Feifei He
Theory and Practice of Quality and Reliability Engineering in Asia Industry
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  • Year: 2017
  • Author: Cher Ming Tan, Thong Ngee Goh (eds.)
Future Learning in Primary Schools: A Singapore Perspective
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  • Year: 2016
  • Author: Ching Sing Chai, Cher Ping Lim, Chun Ming Tan (eds.)
Mathematical Model of Spontaneous Potential Well-Logging and Its Numerical Solutions
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  • Year: 2014
  • Author: Tatsien Li, Yongji Tan, Zhijie Cai, Wei Chen, Jingnong Wang (auth.)
Knowledge Discovery and Data Mining
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  • Year: 2012
  • Author: Xiao Li Wang, Wei Wu, Lei Yu (auth.), Honghua Tan (eds.)
Dimensional Analysis
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  • Year: 2011
  • Author: Qing-Ming Tan (auth.)
Dimensional Analysis
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  • Year: 2011
  • Author: Qing-Ming Tan (auth.)
Mathematical Logic: Foundations for Information Science
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  • Year: 2014
  • Author: Wei Li (auth.)
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