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Modeling of Electrical Overstress in Integrated Circuits
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  • Year: 1995
  • Author: Carlos H. Díaz, Sung-Mo Kang, Charvaka Duvvury (auth.)
Hot-Carrier Reliability of MOS VLSI Circuits
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  • Year: 1993
  • Author: Yusuf Leblebici, Sung-Mo (Steve) Kang (auth.)
Design Automation for Timing-Driven Layout Synthesis
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  • Year: 1993
  • Author: Sachin S. Sapatnekar, Sung-Mo Kang (auth.)
System level ESD co-design
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  • Year: 2015
  • Author: Duvvury, Charvaka; Gossner, Harald
ESD In Silicon Integrated Circuits
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  • Year: 2002
  • Author: E. Ajith Amerasekera, Charvaka Duvvury
Electrothermal Analysis of VLSI Systems
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  • Year: 2002
  • Author: Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo Steve Kang (auth.)
Oncologic Imaging: Bone Tumors
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  • English
  • Year: 2017
  • Author: Heung Sik Kang, Joong Mo Ahn, Yusuhn Kang (auth.)
Educar para reencantar a vida
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  • Portuguese
  • Year: 2006
  • Author: Jung Mo Sung