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Bayesian Process Monitoring, Control and Optimization
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  • English
  • Year: 2006
  • Author: Bianca M. Colosimo, Enrique del Castillo
Process Optimization: A Statistical Approach
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  • English
  • Year: 2007
  • Author: Enrique del Castillo
Process Optimization: A Statistical Approach
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  • English
  • Year: 2007
  • Author: Enrique del Castillo
Run-to-Run Control in Semiconductor Manufacturing
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  • English
  • Year: 2000
  • Author: James Moyne, Enrique del Castillo, Arnon M. Hurwitz
Process Optimization: A Statistical Approach
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  • English
  • Year: 2007
  • Author: Professor Enrique Del Castillo (auth.)
Geometric Tolerances: Impact on Product Design, Quality Inspection and Statistical Process Monitoring
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  • English
  • Year: 2010
  • Author: Antonio Armillotta, Quirico Semeraro (auth.), Bianca M. Colosimo, Nicola Senin (eds.)
Geometric Tolerances: Impact on Product Design, Quality Inspection and Statistical Process Monitoring
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  • English
  • Year: 2010
  • Author: Antonio Armillotta, Quirico Semeraro (auth.), Bianca M. Colosimo, Nicola Senin (eds.)
Run-to-run control in semiconductor manufacturing
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  • English
  • Year: 2001
  • Author: James Moyne; Enrique Del Castillo; Arnon Max Hurwitz
Functional Equations and Modelling in Science and Engineering (Pure and Applied Mathematics)
  • DJVU
  • English
  • Year: 1992
  • Author: Enrique Castillo
Conditional Specification of Statistical Models
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  • English
  • Year: 1999
  • Author: Barry C. Arnold, Enrique Castillo, Jose M. Sarabia
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