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Optical and Electrical Properties of Nanoscale Materials
  • PDF
  • English
  • Year: 2022
  • Author: Alain Diebold, Tino Hofmann
Handbook of Silicon Semiconductor Metrology
  • PDF
  • English
  • Year: 2001
  • Author: Alain C. Diebold (Editor)
Handbook of Silicon Semiconductor Metrology
  • PDF
  • English
  • Year: 2001
  • Author: Alain C. Diebold (ed.)
Handbook of silicon semiconductor metrology
  • PDF
  • English
  • Year: 2001
  • Author: A C Diebold
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)
  • DJVU
  • English
  • Year: 2001
  • Author: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula