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Handbook of Silicon Semiconductor Metrology
  • PDF
  • English
  • Year: 2001
  • Author: Alain C. Diebold (Editor)
Handbook of silicon semiconductor metrology
  • PDF
  • English
  • Year: 2001
  • Author: A C Diebold
Optical and Electrical Properties of Nanoscale Materials
  • PDF
  • English
  • Year: 2022
  • Author: Alain Diebold, Tino Hofmann
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)
  • DJVU
  • English
  • Year: 2001
  • Author: David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula
The Known, the Unknown, and the Unknowable in Financial Risk Management: Measurement and Theory Advancing Practice
  • PDF
  • English
  • Year: 2010
  • Author: Francis X. Diebold (editor), Neil A. Doherty (editor), Richard J. Herring (editor)
The Known, the Unknown, and the Unknowable in Financial Risk Management: Measurement and Theory Advancing Practice
  • PDF
  • English
  • Year: 2010
  • Author: Francis X. Diebold (editor); Neil A. Doherty (editor); Richard J. Herring (editor)
An atlas of flaps of the musculoskeletal system
  • PDF
  • English
  • Author: Alain C Masquelet; Alain Gilbert