Home Advanced Search

Advanced Search - Page 1

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale
  • PDF
  • English
  • Year: 2007
  • Author: S. V. Kalinin, A. Gruverman (auth.), Sergei Kalinin, Alexei Gruverman (eds.)
Proceedings of the Sixth Symposium on Mössbauer Effect Methodology New York City, January 25, 1970
  • PDF
  • English
  • Year: 1971
  • Author: Rolfe H. Herber (auth.), Irwin J. Gruverman (eds.)
Mössbauer Effect Methodology: Proceedings of the Fifth Symposium on Mössbauer Effect Methodology New York City, February 2, 1969
  • PDF
  • English
  • Year: 1970
  • Author: Hans A. Stöckler, Hirotoshi Sano (auth.), Irwin J. Gruverman (eds.)
Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
  • PDF
  • English
  • Year: 2011
  • Author: Peter Maksymovych (auth.), Sergei V. Kalinin, Alexei Gruverman (eds.)
Mössbauer Effect Methodology: Volume 10
  • PDF
  • English
  • Year: 1976
  • Author: W. N. Delgass (auth.), Irwin J. Gruverman, Carl W. Seidel (eds.)
Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach
  • PDF
  • English
  • Year: 2004
  • Author: S. V. Kalinin, D. A. Bonnell (auth.), Dr. Marin Alexe, Dr. Alexei Gruverman (eds.)
Mössbauer Effect Methodology: Volume 7 Proceedings of the Seventh Symposium on Mössbauer Effect Methodology New York City, January 31, 1971
  • PDF
  • English
  • Year: 1971
  • Author: Dietrich Schroeer, Randolph L. Lambe, Charles D. Spencer (auth.), Irwin J. Gruverman (eds.)
Mössbauer Effect Methodology
  • PDF
  • English
  • Year: 1974
  • Author: E. König, G. Ritter (auth.), Irwin J. Gruverman, Carl W. Seidel, David K. Dieterly (eds.)
Mössbauer Effect Methodology: Volume 8 Proceedings of the Eighth Symposium on Mössbauer Effect Methodology New York City, January 28, 1973
  • PDF
  • English
  • Year: 1973
  • Author: J. P. Brown, R. L. Cohen, K. W. West (auth.), Irwin J. Gruverman, Carl W. Seidel (eds.)